测定晶界偏析的一种新方法——折射率法

ONE NEW METHOD DETERMINATING DEVIATION EXSOLUTE OF CRYSTAL BOUNDARY-REFRINGENCE METHOD

晶界的偏析作用,对材料性能的影响极大。因此,在研制新材料时,必然要经常检测晶界的偏析,一般都采用X射线衍射仪,电子探针微区分析仪,俄歇电子能谱仪等。这些仪器昂贵,分析费用高,而且仅少数科研机构、高校才有这些设备,为检测工作带来诸多不便,本文提出一种设备简单、费用低廉、准确可靠的方法——折射率法。

The effects of the deviating exsolute of crystal boundary have a great influence upon the material property. So,while we synthesize the materials ,it is neccessary to test the deviating exsolute of crystal boundary. And we often adopt a serious of instruments,such as X-ray diffraction spectroscopy,electron probe microanalysis and Auger electron spectroscopy. However,only a few instituts and universities have these expensive instruments, and the expenses of test is quite high. These disadvantaged conditions make it inconveninent for test. Based on this point,this paper pose a method which is simple to operate,cheap and accurate to test. It is so-called refrin-gence method.