摘要
在使用K故障诊断法时,为提高电路的可诊断性,可以采取诸如增加可及节点,或改变激励点,增加激励和测量次数等办法。本文对这些措施的有效性,以及如何增加可及节点问题进行了详细的讨论,特别着重对比较有效的多激励法进行研究,给出了用多激励法进行诊断时,电路可K故障支路诊断的条件。
In view of K-fault testability, the topological construction of a practical circuif is far from ideal. In order to improve the testability of a circuit, it is used to increase the number of accessible nodes or to use multi-excitation method. Effectiveness of these methods and feasibility choosing accessible nodes arc discussed in detail. The conditions for multi-excitation testability are presented.
关键词
线性电路
K故障诊断法
故障诊断
Analog circuit
Fault diagnosis
K-fault diagnosis
Testability
