摘要
提出了一种基于数据流准则的测试数据自动生成的算法。该算法采用ALL-DU-PATHS覆盖准则,应用Warshall算法来计算判定DU对的可行可测性,通过优化选取覆盖DU对的测试序列,给出了基于测试序列的测试数据自动生成的方法,最后通过实例和实验进行了验证。
An algorithm to automatic test data generation based on data flow rules is presented in this paper. The ALL-DU-PATHS data flow rule is introduced, and the Warshall method is used to check the feasibility and mensurability of DU-pair in the algorithm. The automatic test data generation approach based on test sequence is given after selecting test sequence on DU-pair coverage. Finally, the algorithm is checked by example and experiment.
出处
《微电子学与计算机》
CSCD
北大核心
2007年第1期5-8,14,共5页
Microelectronics & Computer
基金
国家"863"高技术研究发展计划基金项目(2003AA1Z2610)
