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Characterization of (100)-orientated diamond film grown by HFCVD method with a positive DC bias voltage

Characterization of (100)-orientated diamond film grown by HFCVD method with a positive DC bias voltage
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摘要 The (100)-orientated diamond film was deposited by hot-filament chemical vapor deposition (HFCVD) technology with a positive DC bias voltage. The morphology, X-ray diffraction (XRD), RAMAN spectrum and dark current versus applied voltage characteristics analysis show that the positive dc bias can increase the nucleation density and (100)-orientated growth, making the growth of the high quality diamond film easier and cheaper than using other methods. The (100)-orientated diamond film was deposited by hot-filament chemical vapor deposition (HFCVD) technology with a positive DC bias voltage. The morphology, X-ray diffraction (XRD), RMAN spectrum and dark current versus applied voltage characteristics analysis show that the positive dc bias can increase the nucleation density and (100)-orientated growth, making the growth of the high quality diamond film easier and cheaper than using other methods.
出处 《中国有色金属学会会刊:英文版》 CSCD 2006年第B01期313-316,共4页 Transactions of Nonferrous Metals Society of China
基金 Project (60577040) supported by the National Natural Science Foundation of China Project(0404) supported by Shanghai Foundation of Applied Materials Research and Development Project(T0101) supported by Shanghai Leading Academic Disciplines
关键词 金刚石膜 定向生长 HFCVD法 正DC偏压 半导体材料 表征 (100)-orientation diamond film , HFCVD positive bias
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二级参考文献2

  • 1Chen Qijin,Appl Phys Lett,1996年,68卷,2450页
  • 2Yugo S,Appl Phys Lett,1991年,58卷,1036页

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