Z-扫描技术测量(Na_(0.5)Bi_(0.5))TiO_3薄膜非线性折射率

The Measurement of Optical Nonlinear Refraction Index of (Na_0.5Bi_0.5)TiO_3 Thin Films Using a Z-scan Technique

描述了一种重要的测量多种物质的光学非线性折射率的单光束Z-扫描测试技术,被测样品放置于汇聚高斯光束的光轴(Z轴)上,样品在焦点附近沿Z轴移动,在远场处放置带有小孔的屏,通过测量样品的透过率与样品位置的关系,即可得到材料的非线性折射率.利用此技术,测量了(Na0.5Bi0.5)TiO3薄膜样品的非线性折射率.

The paper described a sensitive single beam Z-scan technique for measurement of the optical nonlinear refractive index for a wide variety of materials. By means of the technique, the transmittance of （Nao.s Bio.s ）TiOa thin films was measured through a finite aperture in the far field as the sample was moved along the propagation path （Z） of a focused Gaussian beam. The nonlinear lefraction index n2 of the sample was achieved .