摘要
通过对平面电磁波在分层媒质中反射特性的分析,我们发现多分层媒质具有频率吸收特性,即指在一些特定频率处反射系数为0(无耗媒质)或为最小,这些特定的频率此处叫做吸收频率;而且在吸收频率与媒质之间存在特定关系。由此我们提出可在频域通过检测吸收频率来估算媒质分层的深度。通过分析媒质损耗特性与反射系数在整个复频城内特性的关系,提出一种旨在抵消由于媒质损耗而致反射波的衰减的信号变换方法。本文中的分析方法可以应用于地层深层的探测。
Through the numerical analysis of reflection characters of plane multilayer media, we find that multilayer media have the frequency absorbing character (FAC), implying that its reflection corfficient is zero or minimum at some certain frequency called absorbing frequency (AF). And there exists some relation between these frequencies and the depth of the interfaces of layers. According to this relation we proposed that the depth of interface can be estimated by zeroes or minimums of reflected wave spectrum and proposed a new method to compensate the attenuation of reflected wave caused by lossy medium. The analysis method in this paper can be applied to the sounnding of earth strata' s depth.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1990年第1期93-98,共6页
Acta Electronica Sinica