摘要
在理学３０６４Ｘ荧光仪上采用十八烷基马来酸（ＯＨＭ）晶体作为色散单元，通过改造电路，调整晶体倾角，获得对碳分析的良好线性，在流气正比计数器（ＦＰＣ）窗膜分别为５μｍ和０．６μｍ条件下，碳元素的峰背比分别达到３８．９１和５４．０４。作者分析了白口铸铁和碳化硅中的碳，结果表明在理学３０６４Ｘ荧光仪上定量分析碳是可行了，具有快速、简便、准确、多元素同时分析的特点。
A method for the XRF determination of carbon with OHM crystal as dispersion unit is described.Through adjusting circuit and crystal angle,the signal to noise ratio could reach 38.19 and 54.04 when the thickness of the FPC window film are 5μm and 0 6μm respectively .The results obtained show that the determination of carbon in white cast iron,graphite and SIC by XRF is fast,simple and accurate,and can meet the requirement of routine analysis.
出处
《分析测试技术与仪器》
1996年第3期38-43,共6页
Analysis and Testing Technology and Instruments
关键词
X射线荧光仪
碳
晶体
X-rayfluorescence spectrometer analysis carbon crystal
