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镀锡钢板铬酸盐钝化膜中铬的X射线光电子能谱分析 被引量:13

X-ray photoelectron spectroscopy analysis of chromium element in chromate passivation film formed on tinplate
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摘要 使用X射线光电子能谱(XPS)分析方法,对镀锡铬酸盐钝化钢板中铬元素的含量、价态以及不同价态化合物的含量进行了研究,并对镀锡钢板铬酸盐钝化膜的形成机理进行了探讨。结果表明,钝化膜中主要含有Cr,O以及Sn元素。在给定的钝化处理工艺条件下,镀锡铬酸盐钝化钢板中铬元素主要是以Cr(OH)3,Cr单质以及Cr2O3的形态存在,在检测中没有发现六价铬离子。铬酸盐钝化膜中Cr,Cr2O3和Cr(OH)3的质量分数分别是2.0%,9.5%,7.5%。 The content and chemical valence of chromium element, and the content of compounds in different chemical valence in chromate passivation film formed on commercial tinplate via a cathodic dichromate treatment were studied by X-ray photoelectron spectroscopy (XPS). The formation mechanism of the chromate passivation film formed on tinplate was studied. From the results, it was shown that there mainly existed Cr, O and Sn in the film, and the chromium element in the film mainly consisted of Cr(OH)3, Cr2O3, and Cr. There was no Cr(VD existing in the passivation film. The contents of Cr, Cr2O3 and Cr(OH)3 were 2.0 %, 9.5% and 7.5 %, respectively.
出处 《冶金分析》 EI CAS CSCD 北大核心 2007年第1期17-20,共4页 Metallurgical Analysis
关键词 镀锡钢板 铬酸盐钝化膜 X射线光电子能谱(XPS) tinplate chromate passivation film chromium X-ray photoelectron spectroscopy (XPS)
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