摘要
用X射线衍射及电子探针微区成分分析技术,研究了ZnO-Bi2O3-Sb2O3-BaO为基的压敏陶瓷的显微结构.除通常的ZnO、Bi2O2和Zn2.33Sb0.67O4晶相之外,发现了一新的晶界相.分析表明,新的晶界相是固溶有微量Zn的BaSb2O6晶相;它以颗粒状夹杂于弥散的Bi2O3晶界相中;随钡含量增加,BaSb2O6相的数量增多,粒径也增大,相应地Zn2.33Sb0.67O4相的数量则减少.同时还发现,晶界层中组分及结构的这种变化,使压敏陶瓷在长期电负荷下工作的稳定性得到改善.
The miorostructure of varistor ceramics based on ZnO-Bi2O3-Sb2O3BaO systems has been investigated by XRD and EPMA techniques. A new grain boundary phase in which trace Zn tobe, dissolved is found besides the known ZnO,Bizoa and Zn2.33Sb0.67O4 crystal phases, it is the BaSb3O6 crystal phase. This phase in grain forms mixes with the dispersed Bi2O3 grain boundary phase. With the increase in the amount of barium additive, it increases in amount and grows in grain size, while Zn2.33 Sb0.67O4 decreases in amount. It is also found that the long life stability of the varistor ceramics under a loaded voltage is improved due to the change of the composition and the microstructure in the intergranular layer.
出处
《应用科学学报》
CAS
CSCD
1996年第3期339-344,共6页
Journal of Applied Sciences
基金
国家自然科学基金