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扫描探针显微镜应用于材料纳米摩擦学研究的若干技术问题 被引量:2

Application of SPM in nano-tribology: some technical aspects
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摘要 扫描探针显微镜已经成为材料纳米摩擦学研究的主要工具之一,本文探讨了扫描探针显微镜应用于材料纳米摩擦学研究的若干测试技术问题,并用摩擦力显微镜对DLC薄膜的纳米摩擦学行为进行了研究. Scanning probe microscope (SPM) has been one of the mostly used instruments for nano-tribology investigation of materials. In this paper, the measurement technique of SPM in such investigations is discussed in detail. The nano-tribological behaviors of DLC film are investigated using friction force microscope.
出处 《物理实验》 2007年第2期11-15,共5页 Physics Experimentation
基金 广东省自然科学基金资助(No.021286)
关键词 纳米摩擦学 扫描探针显微镜 测试技术 nano-tribology scanning probe microscope measurement technique
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参考文献11

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