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发射极空气桥InGaP/GaAs HBT的DC和RF特性分析

Analysis of DC and RF Characterizations of InGaP/GaAs HBT with Emitter Air-Bridge Interconnection
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摘要 为抑制电流增益崩塌,提高HBT的热稳定性,研制了发射极空气桥互连结构的HBT晶体管,应用ICCAP提取参数建立VBIC模型,结合模型参数对三种不同结构HBT的DC和RF特性进行比较分析.与引线爬坡互连结构相比,发射极空气桥互连结构HBT的热阻得到改善,热稳定性提高;与发射极电阻镇流方式相比,发射极空气桥HBT的截止频率(fT)相同,最大振荡频率(fmax)提高,最大稳定功率增益(MSG)高出约5dB. In order to suppress current gain collapse and improve HBT's thermal stability, InGaP/GaAs HBT with novel emitter air-bridge interconnection was designed and fabricated, and its VBIC model was extracted using ICCAP. According to the model parameters, the characterizations of the HBT with different interconnection topologies were compared and analyzed. Contrast with typical climb interconnection HBT, its thermal resistance was reduced, therefore the thermal stability was improved. The cutoff frequency, fT, of the multi-finger HBT with emitter air-bridge interconnection was equal with that of multifinger HBT with climb interconnection and emitter ballasting resistor. But the maximum oscillation frequency, fmax, was higher, and the maximum stable gain, MSG, was 5 dB more than that of typical climb interconnection multi-finger HBT with emitter ballasting resistor.
出处 《电子器件》 CAS 2007年第1期1-4,共4页 Chinese Journal of Electron Devices
基金 中国科学院重大创新项目资助"新型高频 大功率化合物半导体电子器件研究(KGCX2-SW-10)"
关键词 InGaP/GaAs发射极空气桥互连 热阻 镇流电阻 InGaP/GaAs emitter air-bridge interconnection thermal resistance ballasting resistor
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参考文献9

  • 1Ali F,Gupta A,Higgins A.Advances in GaAs HBT Power Amplifiers for Cellular Phones and Military Applications[C]//Microwave and Millimeter-Wave Monolithic Circuits Symposi um,1996.Digest of Papers.:61.
  • 2Wadsworth S D,Davies R A,Davies I,et al.GaInP/GaAs HBTs:State of the Art and Future Trends[C]//1998 International Symposium on Signals,Systems,and Electronics:40.
  • 3Liu W,Nelson W,Hill D,et al.Current Gain Collapse in Microwave Multi-Finger Heterojunction Bipolar Transistors Operated at Very High Power Density[J].IEEE Trans.on Electron Devices,1993,40(11):1917.
  • 4Liu W.Handbook of Ⅲ-Ⅴ Heterojunction Bipolar Transistors[M].John Wiley&Sons,Inc,1998.
  • 5Dettmer R,Jenkins T,Barrette J,et al.Effect of Device Layout on the Thermal Resistance of High-Power Thermlly-Shunted Heterojunction Bipolar Transistors[C]//Microwave Symposium Digest,1996,IEEE MTT-S International,Volume 3:1607.
  • 6Sewell J,Liou L L,Barlage D,et al.Thermal Characterization of Thermally-Shunted Heterojunction Bipolar Transistors[J].IEEE Electron Device Letters,1996,17(1):19.
  • 7樊宇伟,申华军,葛霁,刘新宇,和致经,吴德馨.4GHz 300mWInGaP/GaAs HBT功率管研制[J].电子器件,2006,29(1):12-14. 被引量:2
  • 8Cherepko S V,Hwang JCM.VBIC Model Applicability and Extraction Procedure for InGaP/GaAs HBT[C]//Asia-Pacific Microwave Conference,2001,vol.2:716.
  • 9葛霁,刘新宇,申华军等.GaAs HBT VBIC模型参数的提取[C]//2005全国微波毫米波会议,2005(3):1521.

二级参考文献9

  • 1Ali F,Gupta A,Higgins A.Advances in GaAs HBT Power Ampilifers for Cellular Phones and Military Applications[C].In:IEEE Microwave and Millimeter-Wave Monolithic Circuits Symposium,1996:61.
  • 2Dimitris P,HBT vs.PHEMT vs.MESFET:What's Best and Why,1999.
  • 3Liu W.Handbook of Heterojunction Bipolar Transistor[M],John Wiley&Sons,Inc(1998).
  • 4Yamamoto K,Suzuki S,Ogawa N,InGaP/GaAs HBT MMICs for 5-GHz-Band Wireless Applications-a High P1dB,23/4dB Step Gain Low Noise Amplifier and a Power Amplifier[C].In:Microwave Symposium Digest,2004 IEEE MTT-S International,6-11 June 2004 Vol.2 Page(s):551-554
  • 5Wu C.S,Pao C K,Hu M,et.al.,High Efficiency X-band Power HBT's[C].In:IEEE GaAs IC Symposium,1992:259.
  • 6Ueda O,Kawana A.Current Status of Reliability of InGaP/GaAs HBTs[J].Solid-State Electron,1997,41:1605.
  • 7Fu S T,Yang L W,Low Voltage X-band InGaP/GaAs Power Heterojunction Bipolar Transistor[J].IEEE,MTT-S Digest,1994:675.
  • 8Ohara S,Yamada H,Yamaguchi H,et al,InGaP/GaAs Power HBTs with a Low Bias Voltage[J].IEEE IEDM,1995,791.
  • 9Zheng L P,Liu X Y,Yuan Z P,et.al.,Passivation Ledge Fabrication and its Effect on the Performance of Self-Aligned InGaP/GaAs HBT with Difference Emitter sizes[J],Chinese Journal of Semiconductors,2003.(in Chinese).

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