X射线衍射法测定乳剂中AgX微晶颗粒

Determination of AgX Microcrystal Grains in Film Emulsion by X - Ray Diffraction Techiques

应用Ｘ射线衍射（ＸＲＤ）技术测定了胶片乳剂微晶体颗粒形状，通过（２００）、（４００）和（２２２）、（１１１）面族衍射积分强度，估算了立方体和八面体颗粒的百分含量与电子显微镜法比较，ＸＲＤ法具有迅速、准确、操作简单的特点。

In this paper,X - ray diffraction technique is employed to determine the microcrystal grain in film emulsion and the integral intensity of (200 )、(400) and (222) 、(111)faces diffraction to estimate the percentage content of cubic and octahedral crystal grains.Compared With the electronic microscope method, this method is superior in simplicity and accuracy.