摘要
通过2束平面偏振光的合成推导出椭偏测量的基本原理,给出了用标准1/4波片测量晶体相位延迟量的测量原理.在测量时不必知道待测晶体的具体光轴方位,只需调节标准1/4波片、待测晶体的快(慢)轴与起偏方向平行,然后将晶体逆时针转过45°.测量装置采用了步进电机带动检偏器旋转,使用光电探测器采集数据,经计算机处理,根据数据曲线直接读出待测晶体的相位延迟量.该方法可以方便快捷地测量任意相位延迟.
By analyzing the interference of two plane polarized light beam, the principle of elliptic polarization measurement is deduced and the principle of measuring the phase delay of crystals using 1/4 wave plate is introduced. In the measurement, we need not know the concrete azimuth of the crystal＇s optical axis. After adjusting the standard 1/4 wave plate so that the fast （slow） axis of the crystal is parallel to the pass axis of the polarizer, the measured crystal is rotated by 45°counter-clockwise. A stepping motor is used to rotate the analyzer. The experimental data are collected by the photodetector and the phase delay of the measured crystal can be obtained directly from the output data. This method can measure arbitrary phase delay conveniently.
出处
《物理实验》
2007年第3期42-45,共4页
Physics Experimentation
