摘要
通过对Ni薄膜热敏电阻进行可靠性试验得出其失效模式,并对失效机理进行了分析。
The failure mode of Ni thin film thermistor is established in this paper through reliability tests, and the failure mechanism is also analyzed.
出处
《仪表技术与传感器》
CSCD
北大核心
1996年第12期13-15,共3页
Instrument Technique and Sensor
关键词
薄膜热敏电阻
可靠性
热敏电阻
Thin Film Thermistor, Reliability, Failure Mechanism.
