摘要
包括半导体制造业在内的许多工业应用要求高纯度气体具有最少的杂质。微量水分的分析特别富有挑战性。光腔衰荡光谱法不但可以快速、准确地分析包括水分在内的微量杂质,而且不需要标准样气。对光腔衰荡光谱法作了简要介绍。
High purity gases are required to have minimal contaminants by many industrial applications, including semiconductor manufacturing. Trace moisture analysis is particularly challenging. Cavity ring-down spectroscopy offers fast and accurate analysis of trace contaminants including moisture, without the need to provide a calibration standard. This article is a brief introduction to the technique.
出处
《低温与特气》
CAS
2007年第1期35-38,共4页
Low Temperature and Specialty Gases
关键词
光腔衰荡光谱
微量气体分析
微量水分分析
绝对测量法
cavity ring-down spectroscopy
trace gas analysis
trace moisture analysis
calibration free