摘要
对一百支ＰＢＣ结构的ＩｎＧａＡｓＰ／ＩｎＰ激光器的检测表明，通过变温的电导数及热阻测试给出的参数及参数随温度的变化可对半导体激光器有效地进行质量评价和可靠性筛选．
Abstract The measurements of one hundred PBC structure InGaAsP/InP Lasers demonstrate that the parameters given by the electronic derivate of varied temperature and thermal resistence and the variation of the parameters with temperature can be used to appraisethe quality and reliability of semiconductor laser effectually.
