期刊文献+

点胶球形阵列封装组件机械弯曲可靠性研究 被引量:1

Mechanical bend Reliability of Ball Grid Array Assembly with Underfill
下载PDF
导出
摘要 本文对比了两组经不同材料充胶的BGA组件和一组未充胶BGA组件在机械弯曲中的可靠性,包括三点弯试验和机械弯曲疲劳试验。结果发现在机械弯曲可靠性试验中,U1、U2材料的填充均能提高焊点的机械弯曲可靠性,并且U1的效果更好。通过对试样剖面显微观察,发现在用U1充胶的样品中,失效发生在焊点、PCB板处;而在其它两组样品中,失效发生在焊点、PCB板和铜焊盘三处。 In this paper, three groups of BGA assemblies are investigated and compared in mechanical bend fatigue test and three point bend test, they are without underfill material, with U1 material, with U2 material, respectively. The results show that, in the mechanical bend fatigue test and three point bend test, the underfill material of U 1 and U2 both can improve the mechanical bend reliability of BGA assemblies, and U 1 material performs better. Through the optical microscope, cracks can be found in solder and PCB material in the BGA assemblies with U1 material. In the other two groups, the cracks can be found in solder, copper pad, and PCB material.
出处 《中国集成电路》 2007年第3期63-67,共5页 China lntegrated Circuit
关键词 点胶 机械弯曲可靠性 三点弯试验 机械弯曲疲劳 underifill mechanical bend fatigue three point bend
  • 相关文献

参考文献5

  • 1[1]S.C.Hung,P.J.Aheng,etc.Board level reliability of PBGA using flex substrate[J].Microelectronics Reliability,2000,(41):677-687
  • 2[2]Jieping Zhang,etc.Fatigue crack propagation behavior of underfill materials in microelectronic packaging[J].Material Science and Engineering,2001(A314):194-200
  • 3张群,谢晓明,陈柳,王国忠,程兆年.倒装焊底充胶分层与SnPb焊点热疲劳的可靠性[J].金属学报,2000,36(10):1072-1076. 被引量:5
  • 4[4]J.H.Okura,S.Shetty,etc.Guidelines to select underfills for flip chip on board assemblies and compliant interposers for chip scale package assemblies[J].Microelectronics Reliability,2000(40):1173-1180
  • 5[5]王从曾主编.材料性能学[M].北京:北京工业出版社,2005.5

二级参考文献1

共引文献4

同被引文献2

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部