Si-PIN硅条带探测器的电子学测试

Test of Si-PIN strip detector by electronic method

采用电子学等效方法对所研制的Si-PIN条带探测器的基本性能进行测试。Si-PIN条带探测器是在一个硅基片上刻蚀多个条带探测器,常用于空间探测中的粒子方向测量。介绍了对Si-PIN条带探测器电子学等效测试方法和结果,重点探讨了条带之间的串扰问题。

We have tested the basic performances of the Si-PIN strip detector, which developed by the Institute of Microelectronics of Peking University, with the electronic method. The Si-PIN strip detector is constructed as several strip detectors in one silicon slice, and can be generally used to measure the particle directions in the space exploration. This paper gives a detail description of the electronic test, and discusses the interfere between strips. For our sample, the amount of the cross-disturbance to a neighbour strip is 5.9 per cent. It depends on the gap between strips and the capacitance of the strips.