智能机内测试研究综述

Study of Intelligent Built-in Test

机内测试(BIT)是一种能显著提高系统测试性和诊断能力的重要技术,已大量应用于当代航空系统和武器装备中。但虚警问题是困扰BIT应用的重大难题,并严重影响着武器装备的战备完好性和全寿命周期费用;因此,为从根本上解决BIT的虚警问题,智能BIT技术就成为测试领域21世纪的重点研究项目之一;首先简要介绍了BIT虚警的两个主要产生原因,然后重点概述了智能BIT的发展状况,并分析了当前研究方法中存在的不足,最后在研究BIT不确定性的基础上提出了基于粗糙集的智能BIT故障诊断新技术,并指出了该技术中需要研究的若干关键问题。

The Built-in Test （BIT） is an important technology that can greatly improve the testability and diagnosis capability of the system,and now it has been successfully applied in the aviation system and weapon equipment. However,the false alarm problem is one of the important factors that prevent BIT from being more extensively applied, and seriously affect the operational readiness and life cycle cost of weapon equipments. In order to reduce the high false alarm rate, intelligent BIT is a key test technique that should be well studied in the 21th century. Two main factors inducing BIT false alarm are firstly analyzed. Then, the achievements and development trends of intelligent BIT are reviewed in detail,and the shortcomings in today＇s research are discussed. Finally,a new rough set theory-based intelligent BIT fault diagnosis technique is presented according to the investigating of the BIT uncertainty, and the key problems to be studied are also pointed out.