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采样间隔和投影数对SR-XFMT重构质量的影响(英文)

Influence of Sampling Interval and Number of Projections on the Quality of SR-XFMT Reconstruction
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摘要 同步辐射微束X射线荧光CT(SR-XFMT)是一种能无损、高空间分辨和高灵敏地探测样品内部元素含量和分布的新技术.对SR-XFMT实验进行了计算机模拟,讨论了采样间隔和投影数对重构质量的影响,分析发现采样间隔对重构质量的影响比投影数的影响要大. Synchrotron Radiation based X-ray Fluorescent Microtomography (SR-XFMT) is a nondestructive technique for detecting elemental composition and distribution inside a specimen with high spatial resolution and sensitivity. In this paper, computer simulation of SR-XFMT experiment is performed. The influence of the sampling interval and the number of projections on the quality of SR-XFMT image reconstruction is analyzed. It is found that the sampling interval has greater effect on the quality of reconstruction than the number of projections.
出处 《高能物理与核物理》 CSCD 北大核心 2007年第4期409-413,共5页 High Energy Physics and Nuclear Physics
关键词 SR-XFMT 图像重构 采样间隔 投影数 SR-XFMT, image reconstruction, sampling interval, number of projections
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