基于遗传算法的转移阻抗测试装置优化设计

Optimization design of transfer impedance testing device

提出了一种新的基于遗传算法的宽带电磁干扰(EMI)衬垫转移阻抗(TI)测试装置优化设计方法,获得了宽频带(0～2GHz)下的等效电路。以测试装置结构所决定的分布参数(L、C1、C2)为优化对象,以输入阻抗为优化目标,建立了衬垫测试系统的目标函数;优化前后输入阻抗理论值比较表明:采用优化的测试装置进行测试,输入阻抗误差显著减小,并且这一结论在通常意义下都有效。

A novel broadband transfer impedance （TI） testing device design based on the genetic algorithm （GA） is presented and equivalent circuit of broadband（0～2 GHz）is obtained. Taken distribution parameters（L、C1、C2） determined by testing device dimension as the parameters optimized and input impedance as the object optimized, the objective function of testing device is constructed. By comparing input impedance values before and after optimization, it is showed that the error of input impedance decreases sharply when improved testing device is adopted.