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高充电致高电压太阳阵持续飞弧放电的实验研究 被引量:3

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摘要 空间高压太阳阵表面静电放电(ESD)引起持续飞弧放电而导致航天器大功率电源系统永久性损坏的事件在国外已有多次报道.针对砷化镓和硅高压太阳阵进行ESD地面模拟实验,通过两类高压太阳阵样品充放电对比实验,重点分析高压太阳阵持续飞弧放电形成机理.实验表明持续飞弧放电引起高压太阳阵串间击穿短路,导致太阳阵自身功率持续输出并形成永久性短路回路.持续飞弧放电的发生与高压阵结构、高压阵工作电压、ESD特征以及电池材料等多种因素相关.
出处 《中国科学(E辑)》 CSCD 北大核心 2007年第3期344-350,共7页 Science in China(Series E)
基金 真空低温技术与物理国家重点实验室基金项目(编号:51475030504DZ2801) 国家高技术研究发展计划(编号:2002AA732158)资助
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