利用相关分析法测量空间光调制器的相位调制特性

Characterization for the phase modulator property of spatial light modulators in an optical correlator by using correlation analysis

基于一维干涉条纹图像的相关分析法可实现液晶空间光调制器相位调制特性的测试。给出了XGA2L11型电寻址液晶空间光调制器的相位现场测试原理、测试装置和测试步骤。利用范德卢格特型光电混合相关器对测试结果进行了实验验证。结果表明,该方法具有原理简单、适应性强和精度高等优点。

A method of measuring the phase modulation characteristics of filter spatial light modulator by using correlation analysis the data of one-dimensional interference fringe in the Vanderlugt correlator is suggested. The in-situ measurement principle, set-up and processing of the phase modulation characteristic of XGA2L11 are presented. The experiment results are verified by using Vanderlugt correlator, it shows that the method can be used to measure phase modulation characteristics of spatial light modulator in accuracy and simplicity.