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微斜长石(010)解理面的原子力显微镜研究 被引量:1

ATOMIC FORCE MICROSCOPY OF MICROCLINE {010} CLEAVAGE FACE
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摘要 The {010} cleavage face of microcline was examined by atomic force microscopy. Lmages down to atomic-resolution were obtained and explained geometrically. The author believes that the peaks on the AFM images obtained are due to K atoms and [SiO4] groups. The {010} cleavage face of microcline was examined by atomic force microscopy. Lmages down to atomic-resolution were obtained and explained geometrically. The author believes that the peaks on the AFM images obtained are due to K atoms and [SiO4] groups.
出处 《矿物学报》 CAS CSCD 北大核心 1996年第3期242-244,T001,共4页 Acta Mineralogica Sinica
基金 国家"八五"攻关项目
关键词 微斜长石 解理面 原子力显微镜 长石 AFM (atomic force microscopy) cleavage face microcline
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参考文献1

  • 1廖立兵,Analytical Instrumentation,1994年,4卷,31页

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