分子电子器件的电性能测试方法

Measurement of the electrical properties of molecular electronic devices

介绍了用于两端分子电子器件电性能测试的纳米孔技术、交叉线接触技术、导电原子力显微镜技术、扫描隧道显微镜技术、纳米间距电极技术以及机械可控断裂结技术.结合分子器件的电性能测试要求,对各类测试方法进行了分析评价,并简要指出了分子器件电性能测试研究的发展趋势.

This paper describes several ways to measure the electrical properties of two - terminal molecular electronic devices, including methods employing nanopores, crossed - wire junctions, conducting atomic force microscopy, scanning tunneling microscopy, nanometer- spaced electrodes and mechanically controllable break junctions. An analysis of these methods based on the test requirements is presented, as well as a brief discussion on new trends in molecular device measurements.