CVD法制备的ZnO纳米线喇曼散射谱的特征

Properties of Raman Scattering of ZnO

要对纳米ZnO晶体进行了喇曼背散射几何配置下的喇曼测试与分析,其样品采用化学气相沉积法(CVD),分别在三种不同的温度下生长而成.在438 cm-1和1152 cm-1位置分别可以观测到纤锌矿结构的ZnO一级散射峰和二级散射峰,同时也可以看到一级散射强度与二级散射强度比的变化.结果显示:用CVD法制备纳米ZnO时,温度(即Zn蒸汽的浓度)只影响ZnO纳米线的形貌特征,而并不影响它的微观结构.

In this abstract, raman test and analysis are done to ZnO crystal under raman back scattering. Nano samples were grown under three different temperature conditions in CVD （Chemical Vapor Deposition） method. At spots 438 cm^-1 and 1 152 cm^-1 , not only the first order scattering peak and second order scattering peak of ZnO of Wurtzite structure, but also first order and second order intensity ratio variation, were observable. Test indicates that, when growing raman ZnO in CVD method, temperature affects only form of ZnO nanowires, but not its microcosmic structure.