摘要
本文阐述了关于模场直径(m.f.d)的Petermann第二定义的优越性,介绍了由这一定义建立的远场掩膜测试系统;考虑到掩膜板各部分的实际透过率,修正了国外文献中m.f.d的计算公式,可以迅速、方便、准确地测定1.3μm和1.55μm处单模光纤的m.f.d。
The advantage of the definition for m. f. d (mode field diameter) given by K. Petermann is stated in this paper, and a far-field mask measuring system established accrding to the definition is introduced. Considering the practical transparence of different areas on a mask plate, we have modified the calculation formula of m. f. d given in some foreign literatures. This system can easily be applied to determine m. f. d of monomode fibres at the low-loss wavelength windows of 1.3μm and 1.55μm by means of the formula derived in this paper.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1989年第6期61-64,共4页
Acta Electronica Sinica
