摘要
本文提出了一种易测试ＰＬＡ的新设计，这种设计使ＰＬＡ易于测试，所增加的硬件只是一个ｍ位移位寄存器．本文还详述了对这种ＰＬＡ进行测试的方法，该测试方法只需要很少的测试向量，测试结果计算简单，具有很高的故障复盖率．
A new approach to the design of programmable logic array (PLA) is proposed.This PLAA canbe easily tested and yet, only one extra hardware is added, mainly a m-bit shift register. Themethods of testing the PLA are also detailed. These methods require few test vectors for testing,evaluate the test easily and obtain high fault coverage.
