稀土精矿中硅和铝的X射线荧光光谱法测定

Determination of Silicon and Aluminium in Rare Earth Concetrate by X-Ray Spectrometric Method

采用标准加入法,以X射线荧光光谱仪测定稀土精矿中硅和铝,不需要用α系数校正复杂的基体效应。由于用先进的仪器分析代替了常规的化学分析,提高了分析速度,分析范围为0.07—1%。

With the Standrd addition method, silicon and aluminium in rare earth concetrate (mixture of rare earth oxide)were determined by x-ray spectrometry. In this work, there is no need to correct the complex matric effects with α-coefficients. The routine chemical analysis can be replaced by the present one. The determination range of the method is 0.03-1.0%.