摘要
本文介绍一种微机化的X射线双晶衍射仪,不但可用于近完整晶体中微小畸变,点阵错配及晶片弯曲等的测量,而且可以作定点定时的强度记录和扫描,以提高信噪比,并使曲线数据化。经微机化后的X射线双晶衍射仪可以对超晶格材料以及离子注入材料作细致的分析。
An x-ray double-crystal diffractometer is reported. It ean be used to make measurement of lattice deformation, lattice mismatch and bend of nearly perfect single crystals. The ratio of signal to noise has been increased significantly and the experimental data are digitized. The instrument can do detailed analysis of materials with superlattice and implanted ions.
出处
《分析仪器》
CAS
1990年第1期34-36,共3页
Analytical Instrumentation
基金
上海冶金研究所离子束开放实验室资助
