期刊文献+

AlGaN/GaN HEMT材料外延技术研究

Research on the Materials Epitaxial Technology of AlGaN/GaN HEMT
下载PDF
导出
摘要 采用低压MOCVD技术在蓝宝石和SiC衬底上生长了本征GaN和AlGaN/GaN HEMT结构材料。生长过程中采用了EpiTUNEⅡ在位监测技术,对材料生长工艺进行了模型分析以及优化控制。在获得具有良好表面形貌、晶体质量以及光荧光谱的GaN本征材料基础上,生长了AlGaN/GaN HEMT结构材料,获得了良好的2DEG性能。 By LP MOCVD, intrinsic GaN and AlGaN/GaN HEMT materials were grown on sapphire and SiC substrate. During growth process, in-situ monitor (EpiTUNE Ⅱ ) was used to analyze the growth model, and the growth control was optimized. Based on intrinsic GaN with fine surface morphology, good crystal quality and perfect photoluminescence spectrum, AlGaN/GaN HEMT structure material was grown, and got fine 2DEG properties.
出处 《微纳电子技术》 CAS 2007年第4期186-189,共4页 Micronanoelectronic Technology
  • 相关文献

参考文献3

  • 1MOLNAR R J, GOTZ W, ROMANO L T, et al. Growth of gallium nitride by hydride vapor-phase epitaxy [J] . Journal of Crystal Growth, 1997, 178 (1-2): 147-156.
  • 2WU X H, BROWN L M, KAPOLNEK D, et al. Defect structure of metal-organic chemical vapor deposition-grown epitaxial(0001) GaN/A1203 [J] . J Appl Phys, 1996, 80: 3228.
  • 3AKASAKI I, AMANO H, KOIDE Y, et al. Effects of ain buffer layer on crystallographic structure and on electrical and optical properties of GaN and Ga1-xAlxN (0<x≤0.4) films grown on sapphire substrate by MOVPE [J] . Journal of Crystal Growth, 1989, 98 (1-2): 209-219.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部