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A New Pre-alignment Approach Based on Four-Quadrant-Photo-Detector for IC Mask 被引量:3

A New Pre-alignment Approach Based on Four-Quadrant-Photo-Detector for IC Mask
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摘要 In this paper, a new pre-alignment approach based on Four-Quadrant-Photo-Detector (FQPD) for IC mask is presented. The voltage outputs from FQPDs are the functions of alignment mark's position offsets with respect to FQPDs. The functions are obtained with least squares error (LSE)-based polynomial fitting after the normalization of experimental data. As the acquired functions are not monotonic about their variables, the alignment mark's position offset cannot be given by direct inverse operation on the obtained functions. However, the piecewise polynomial fitting gives the inverse function, with which the alignment mark's position offset can be predicted according to the voltage outputs of FQPDs. On the basis of prediction, a pre-alignment control strategy is proposed. The feasibility and robustness of the pre-alignment approach is shown by experiments. Furthermore, the results demonstrate that the maximum error of mask's position offset in the X- and Y- directions is less than 15μm after coarse pre-alignment. Keywords: Four-Quadrant-Photo-Detector (FQPD), pre-alignment, IC mask, polynomial fitting In this paper, a new pre-alignment approach based on Four-Quadrant-Photo-Detector (FQPD) for IC mask is presented. The voltage outputs from FQPDs are the functions of alignment mark's position offsets with respect to FQPDs. The functions are obtained with least squares error (LSE)-based polynomial fitting after the normalization of experimental data. As the acquired functions are not monotonic about their variables, the alignment mark's position offset cannot be given by direct inverse operation on the obtained functions. However, the piecewise polynomial fitting gives the inverse function, with which the alignment mark's position offset can be predicted according to the voltage outputs of FQPDs. On the basis of prediction, a pre-alignment control strategy is proposed. The feasibility and robustness of the pre-alignment approach is shown by experiments. Furthermore, the results demonstrate that the maximum error of mask's position offset in the X- and Y- directions is less than 15μm after coarse pre-alignment. Keywords: Four-Quadrant-Photo-Detector (FQPD), pre-alignment, IC mask, polynomial fitting
出处 《International Journal of Automation and computing》 EI 2007年第2期208-216,共9页 国际自动化与计算杂志(英文版)
基金 This work was supported by National High Technology Research and Development Program of PRC (No. 2002AA420040) National 973 Program of PRC (No. 2002CB312200).
关键词 Four-Quadrant-Photo-Detector (FQPD) pre-alignment IC mask polynomial fitting. Four-Quadrant-Photo-Detector (FQPD), pre-alignment, IC mask, polynomial fitting.
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参考文献4

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