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2.5Gb/s/ch 0.18μm CMOS Data Recovery Circuit

2·5Gb/s/ch 0·18μm CMOS数据恢复电路(英文)
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摘要 A 2.5Gb/s/ch data recovery (DR) circuit is designed for an SFI-5 interface. To make the parallel data bit-synchronization and reduce the bit error rate (BER) ,a delay locked loop (DLL) is used to place the center of the data eye exactly at the rising edge of the data-sampling clock. A single channel DR circuit was fabricated in TSMC's standard 0. 18μm CMOS process. The chip area is 0. 46mm^2. With a 2^32 - 1 pseudorandom bit sequence (PRBS) input,the RMS jitter of the recovered 2.5Gb/s data is 3.3ps. The sensitivity of the single channel DR is less than 20mV with 10-12 BER. 设计了一个应用于SFI-5接口的2·5Gb/s/ch数据恢复电路.应用一个延迟锁相环,将数据的眼图中心调整为与参考时钟的上升沿对准,因而同步了并行恢复数据,并降低了误码率.采用TSMC标准的0·18μm CMOS工艺制作了一个单通道的2·5Gb/s/ch数据恢复电路,其面积为0·46mm2.输入231-1伪随机序列,恢复出2·5Gb/s数据的均方抖动为3·3ps.在误码率为10-12的条件下,电路的灵敏度小于20mV.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第5期692-695,共4页 半导体学报(英文版)
关键词 data recovery delay locked loop bit-synchronization 数据恢复 延迟锁相环 位同步
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参考文献7

  • 1Dartneil P. Serdes framer interface level 5 (SFI-5) :implementation agreement for 40Gb/s interface for physical layer devices. Optical Internetworking Forum,2002
  • 2Xu Min. An SFI-5 compliant 16:4 multiplexer for OC-768 systems. IEEE International Solid-State Circuits Conference, 2003,1 :283
  • 3Yang Fuji. A 1.5-V 86-mW/ch 8-channel 622-3125Mb/s/ch CMOS SerDes macrocell with selectable Mux/Demux ratio. ISSCC Digest of Technical Papers,2002:48
  • 4Pottbacker A. A Si bipolar phase and frequency detector IC for clock extraction up to 8Gb/s. IEEE J Solid-State Circuits, 1992,27(12) : 1747
  • 5Soyuer M. A monolithic 2.3-Gb/s 100-mW clock and data recovery circuit in silicon bipolar technology. IEEE J Solid-State Circuits,1993,28(12) : 1310
  • 6Pallotta A.A low-power clock and data recovery circuit for 2. 5Gb/s SDH receivers. Low Power Electronics and Design,2000,67
  • 7Muller P. Top-down design of a low-power multi-channel 2.5-Gbit/s/channel gated oscillator clock-recovery circuit. Design,Automation and Test in Europe, Proceedings, 2005: 258

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