摘要
应用直流非平衡磁控溅射系统在不同实验条件下制备了CNx薄膜材料,其最大氮原子百分含量为37%。通过傅里叶变换红外光谱、X光光电子能谱以及显微压痕法的测量和分析,对得到的CNx薄膜材料中的原子化学结合状态、硬度等性质进行了表征。
CN X thin films were grown using dc unbalanced magnetron sputtering at different experimental conditions.,The maximum of nitrogen concentration in our CN x films is 37 at%.From the measurements and analyses of FTIR. XPS,and manoindentation,the characterization of CN x films has been performed
出处
《材料科学与工艺》
EI
CAS
CSCD
1997年第1期8-11,共4页
Materials Science and Technology
关键词
CNX
薄膜
生长
表征
CN X thim Films, Growth, Characterization