摘要
本文所述的局部屏蔽法即是在X射线测量过程中的下遮挡法,即是将被测部位暴露出来,而将其余部位进行遮挡以对X射线进行屏蔽。局部屏蔽法是解决应力梯度测量中的一种有效方法。
The local covered X ray technique used in the process of residual stress measurement is a technique means that the concerned area is exposed and the rest of area can be screened from X ray.This technique is an efficient method for measuring the area with stress gradient.The key technique is presented in this paper and good results are obtained.
出处
《实验力学》
CSCD
北大核心
1997年第1期135-138,共4页
Journal of Experimental Mechanics