用于处理复杂对称结构电磁散射的扩展GIM技术

THE EXTENDED GIM TECHNIQUE FOR DEALING WITH ELECTROMAGNETIC SCATTERING PROBLEMS OF COMPLEX SYMMETRIC SCATTERING STRUCTURE

由于原广义镜像法只能够处理具有四面对称的电磁散射问题。为此，在广义镜像法原理的基础上，给出了处理一种具有特殊复杂对称结构的电磁散射问题的新方法，称之为扩展ＧＩＭ方法。对比结果表明：利用扩展ＧＩＭ，较之于原ＧＩＭ，在对高于四面对称的散射体的求解过程中，能够节约更多的上机运算时间和运算所需的存储；还通过该方法对正六面柱的具体分析。

The Original Generalized Image Method can only deal with four aspect symmetric scattering body.On the basis of the original GIM,a developed method termed Extended GIM is proposed.The Extended GIM can save a great deal of calculation time and storage of computer when useing it for dealing with the scattering sturcture of higher symmetry than the four aspect symmetric one.A six aspect symmetric example is also given.