摘要
本文阐明了光切法三维轮廓测量的原理，分析了光切法在实际测量系统中的应用——双光源光切法，提出了与之相适应的空间及图像匹配方法。
The principle of 3 D profile testing by light sectioning is described. The application of this method in practical testing system——double source light sectioning is discussed and the appropriate method to mate the space and image is given. Such method has proved itself accuracy in our experiments.
出处
《光学技术》
CAS
CSCD
1997年第2期39-43,共5页
Optical Technique
基金
国家"八五"重点科技攻关项目
关键词
三维
轮廓测量
光切法
three dimension profile testing, light sectioning, application.
