期刊文献+

HfO2高激光损伤阈值薄膜的制备及特性研究 被引量:1

Characterization and Preparation of Hafnia Films with High Laser-induced Damage Threshold
下载PDF
导出
摘要 采用水热合成技术,制备了HfO2胶体,用旋涂法镀制了单层HfO2介质膜。采用XRD,椭偏仪,红外光谱(FTIR)等方法对薄膜进行了测试和表征,用输出波长为1064nm,脉宽为10ns的电光调Q激光系统产生的强激光测试其激光损伤阈值。研究了热处理温度对薄膜厚度、折射率、红外光谱、晶态以及激光损伤阈值的影响,并对薄膜的激光损伤形貌进行了分析。研究结果表明:HfO2薄膜的折射率可达到1.655;采用150℃左右的温度对薄膜进行热处理可以提高薄膜的激光损伤闽值,此时薄膜的激光损伤阈值高达42.32J/cm^2(1064nm,10ns),大大高于物理法制备的HfO2薄膜的激光损伤阂值(8.6J/cm^2,1064nm。12ns)。 HfO2 sol was obtained by hydrothermal synthesis from HfOCl2. 8H2O. Thin HfO2 films were prepared with spin coating method. The HfO2 films were characterized by ellipsometer, FTIR and X-ray diffraction respectively. And 1-on-1 laserinduced damage threshold tests on HfO2 films were carried out with a Q-switched Nd-YAG high power laser at 1 064 nm with a pulse width of 10 ns. The influences of the heating treatment on the properties of the HfO2 were studied and the morphologies of the damaged films were analyzed. The experimental results showed that the HfO2 thin films could obtain a refractive index of 1. 655, and the HfO2 films performed excellent anti-laser damage properties. The LIDT of the thin films heated at 150 ℃ was 42.32 J/cm^2( 1 064 nm, 10 ns), which is much higher than that of the HfO2 films derived from physical methods(8.6 J/cm^2, 1 064 nm, 12 ns).
出处 《武汉理工大学学报》 CAS CSCD 北大核心 2007年第E01期176-179,共4页 Journal of Wuhan University of Technology
基金 国家自然科学基金重点资助项目(21033040),国家高技术863计划(2002AA84052),上海科委纳米专项(0552nm08),教育部跨世纪优秀人才计划资助项目,上海市重点学科建设资助项目(02SL001)和上海市科技攻关计划(055211010).
关键词 HFO2薄膜 旋涂工艺 热处理 高折射率 激光损伤阈值 HfO2 thin films spin-coating technology heating treatment high refractive index laser-induced damage threshold
  • 相关文献

参考文献8

  • 1Blanc P,HovnanianN,Cot D,et al.Synthesis of Hafnia Powders and Nanofiltration Membranes by Sol-gel Process[J].Journal of Sol-Gel Science and Technology,2000,17:99-110.
  • 2Yu J J,Fang Q,Wang Z M,et al.Hafnium Oxide Layers Derived by Photo-assisted Sol-gel Processing[J].Applied Surface Science,2003,208-209:676-681.
  • 3Belleville P F.Ammonia-hardening of Porous Silica Antireflective Coating[A].Proc SPIE[C].1994,2285:25-32.
  • 4Blanc P,Larbot A,Cot L.Hafnia Colloidal Solution from Hydrothermal Synthesis and Membrane Preparation[J].Journal of the European Ceramic Society,1997,17:397-401.
  • 5沈军,张勤远,杨天河,邓忠生,周斌,王珏,陈玲燕.水热法制备ZrO_2高折射率薄膜[J].原子能科学技术,1999,33(4):328-331. 被引量:2
  • 6Lakhlifi A,Leroux Ch,Satre T P,et al.Hafnia Powders (HfO2):Elaboration and Characterization by Transmission Electron Microscopy[J].Journal of Solid State Chemistry,1995,119(2):289-298.
  • 7高卫东,张伟丽,范树海,张大伟,邵建达,范正修.HfO_2薄膜的结构对抗激光损伤阈值的影响[J].光子学报,2005,34(2):176-179. 被引量:29
  • 8杨帆,沈军,周斌,吴广明,罗爱云,孙骐,J.Mugnier.紫外辐照对溶胶-凝胶光学薄膜性能的影响[J].原子能科学技术,2005,39(6):507-512. 被引量:6

二级参考文献24

  • 1中西香尔 索罗曼PH.红外光谱分析100例[M].北京:科学出版社,1984..
  • 2哈比希KH 严立(译).材料的磨损与硬度[M].北京:机械工业出版社,1984..
  • 3Smith D, Baumeister P. Refractive index of some oxide and fluoride coating materials. Appl Opt, 1979,18(1): 111 ~ 115.
  • 4Chow R, Falabella S, Loomis G E, et al. Reactive evaporation of low-defect hafnia. Appl Opt, 1993,32 (28):5567 ~ 5574.
  • 5Alvisi M, Giulio M Di, Marrone S G, et al. HfO2 films with high laser damage threshold. Thin Sold Films, 2000,358(1-2) :250 ~ 258.
  • 6Reicher D,Black P,Junglinhg K, et al. Defect formation in hafnium dioxide thin films. Appl Opt,2000,39 (10): 1589 ~1599.
  • 7Macleod H A. Thin-Film Optical Filters. Third Edition,Institute of Physics Publishing Bristol and Philadelphia,2001.
  • 8Ritala M, Leskela M, Niinisto L. Development of crystallinity and morphology in hafnium dioxide thin film grown by atomic layer epitaxy. Thin Solid Films, 1994,250(1-2) :72 ~80.
  • 9JCPDS-International Center for Diffraction Data, 1999,PCPDFWIN V. 2.02, Present by Journal of Research of the National Institute of Standards and Technology.
  • 10Kuo P K, Zhang S Y. A new diffraction theory for the mirage effect and thermal lensing. Progress in Natural Science, 1996,6(11): 191 ~ 205.

共引文献33

同被引文献16

引证文献1

二级引证文献5

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部