摘要
在半偏法测灵敏电流计内阻的实验中引入回路灵敏度,并采取近似处理找出回路灵敏度不足产生误差的最小值范围,同时从理论和实验两方面对回路灵敏度不足产生误差的原因进行分析,从而找到减小这一误差的途径。最后,将回路灵敏度不足产生的误差与仪器的结构误差进行比较,得出回路灵敏度不足产生的误差是半偏法测灵敏电流计内阻误差的一个主要部分。
The paper introduces the return circuit sensitivity in the experiment of the internal resistance by sensitive amperemeter with semi - bias method. We find the minimum of error areas for lack of return circuit sensitivity and get ways to reduce the error through analysing the causes both in theory and by experiment. By comparison of the error from lack of return circuit sensitivity with the instrumental structure error, we prove the former is the chief part of the error of internal resistance by sensitive amperemeter with semi-bias method.
出处
《贵州师范大学学报(自然科学版)》
CAS
2007年第2期91-94,共4页
Journal of Guizhou Normal University:Natural Sciences
关键词
半偏
回路灵敏度
外接电阻
内因
外因
结构误差
semi - bias
return circuit sensitivity
external resistance
internal cause
external cause
error of structure