期刊文献+

基于光切图像处理的表面粗糙度检测系统 被引量:12

Surface roughness measurement system based on light section image processing
下载PDF
导出
摘要 以光切法的测量原理为基础,应用传统双管光切显微镜、CCD摄像装置、虚拟仪器及图像处理技术开发了表面粗糙度检测系统。详述了系统的硬件构成原理和核心器件CCD的选用方法;应用虚拟仪器开发平台LabVIEW及其视觉应用功能开发出检测系统的软件程序,运用图像处理技术从光切显微图像中提取出表面轮廓信号计算粗糙度评定参数。该检测系统能够实现表面粗糙度的自动、快速、多参数测量,通过与触针式粗糙度仪进行测量对比实验,论证了该检测系统能达到满意的精度,测量范围是:0.4~40μm。 The paper presents a surface roughness measurement system which is based on light section principle and consists of conventional light section microscope and CCD camera as well as image processing software. The system configuration and the method of choosing CCD are introduced in detail. Virtual instrument technique and vision function are applied to develop the software. Using the measurement system various surface roughness parameters can be measured automatically and fast. Comparing the measurement results with that of stylus instrument, it is proved that the system has a satisfying measurement precision. The height of surface profile, which can be measured in the system, ranged from 0.4~40μm.
出处 《电子测量技术》 2007年第4期184-187,共4页 Electronic Measurement Technology
关键词 表面粗糙度 光切显微镜 图像处理 虚拟仪器 surface roughness light section microscope image processing virtual instrument
  • 相关文献

参考文献6

二级参考文献12

  • 1周肇飞,王世华,周卫东,迟桂纯.同轴式高分辨率激光轮廓仪[J].仪器仪表学报,1994,15(3):250-254. 被引量:11
  • 2[美]T帕夫利迪斯.计算机图形显示和图像处理[M].北京:科学技术出版社,1987。2..
  • 3[美]T帕夫利迪斯.计算机图形显示和图像处理[M].北京:科学技术出版社,1987..
  • 4[美]RodStephens.Visual Basic高级图形程序设计教程[M].北京:电子工业出版社,1999..
  • 5[1]Sun T, Neuvo Y. Detail-preserving median based filters in image processing. Pattern Recognit. Lett., 1994,15:341-347.
  • 6[2]WangZhou, Zhang David. Progressive switching median filterfor the removal of impulse noise from highly corrupted images. IEEE Trans. On Circuits and Systems,Ⅱ: Analog and Digital Signal Processing, 1999,46(1):.
  • 7[3]WangJung-Hua, Lin Lian-Da. Improved median filter usingminmax algorithm for image processing. Electronics Letters, 31st July, 1997,33(16):.
  • 8[4]Brownrigg D R K. The weighted median filter. Commun. Ass. Comput. Mach., 1984,27(8):807~818.
  • 9S. Watanabe, K. Miyajima. Detecting Building Changes Using Epipolar Constraint from Aerial Images Taken at Different Positions, Proc. Of Int. Cord. on Image Processing, 2001 (2): 201-204.
  • 10[美]Rod Stephens.Visual Basic高级图形程序设计教程[M].北京:电子工业出版社,1999...

共引文献181

同被引文献80

引证文献12

二级引证文献43

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部