摘要
采用Pechini法制备Eu3+掺杂的CeO2:Eu3+薄膜.利用X射线衍射(XRD)﹑原子力显微镜(AFM)和光致荧光光谱(PL)对样品进行表征.结果表明:薄膜样品在700℃就结晶成纯面心立方萤石结构的多晶薄膜;PL激发谱中,300~360 nm的宽带激发峰起源于基质CeO2的吸收.
CeO2: Eu^3+ phosphor films with various Eu^3+ concentrations were prepared by the Peehini method. X-ray diffraetion(XRD), atomic force mieroseopy(AFM) and Photolumines- eenee(PL) measurements were used to characterize the samples. XRD analysis shows that the films with pure cubic-fluorite structure is obtained at the sintered temperature 700 ℃. The PL excitation band at 300-360 nm is due to the charge transfer from O2^- to Ce^4+ and subsequent energy transfer to Eu^3+ in the films.
出处
《汕头大学学报(自然科学版)》
2007年第2期38-42,52,共6页
Journal of Shantou University:Natural Science Edition
基金
广东省自然科学基金资助项目(No:04010998)
人事部留学人员科技活动项目择优资助经费
教育部回国留学人员基金资助项目