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A threshold voltage model MOSFETs considering for high-k gate-dielectric fringing-field effect

A threshold voltage model MOSFETs considering for high-k gate-dielectric fringing-field effect
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出处 《Chinese Physics B》 SCIE EI CAS CSCD 2007年第6期1757-1763,共7页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China (Grant No 60376019).
关键词 门限电压模型 MOSFET 弥散场效应 共形映射 Threshold voltage, MOSFET, conformal mapping, fringing field
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参考文献18

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