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铋层状化合物SrBi_(4-x)Ce_xTi_4O_(15)陶瓷的铁电性能研究 被引量:3

Ferroelectic Properties of Bismuth-layered Compound SrBi_(4-x)Ce_xTi_4O_(15)
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摘要 采用溶胶-凝胶法制备了SrBi4-xCexTi4O15(x=0.2~0.8)铁电陶瓷,X-射线衍射证实随着x掺杂量的增加,晶粒中a、b轴取向的晶粒逐渐增多,与扫描电镜的分析结果一致。介温谱表明样品的居里温度最大为590℃,通过研究铁电性发现,剩余极化和矫顽场先增大后减少,当x=0.6时它们分别达最大值为3.56μC/cm^2和9.38 kV/cm,这是氧空位与晶格畸变共同作用的结果。 Bismuth-layered compound SrBi4-x CexTi4O15 ferroelectric ceramics samples were prepared by Sol-Gel method. The influence of Ce content on the microstructure and ferroelectric properties of SrBi4 Ti4 O15 ceramics were systematically studied. Their microstructure was analyzed by X-ray diffraction; it shows that pure bismuth-layered perovskite phase was formed. The results of the analysis indicated that SrBi1.4 Ce0.6 Ti4 O15 (x= 0.6) sample has better ferroelectric properties with remnant polarization (Pr) of 3.56μC/cm^2 , coercive field (Ec) of 93.8 kV/cm. The highest Curie temperature was 590℃. That can be attributed to the effects of structure distortion and the high concentration oxygen vacancies in the materials during the phase transition.
出处 《压电与声光》 CSCD 北大核心 2007年第3期315-317,共3页 Piezoelectrics & Acoustooptics
基金 国家重大研究计划基金资助项目(90207025) 山东教育厅基金资助项目(03A02)
关键词 铋层 铁电性能 晶格畸变 bismuth-layered ferroelectric structure distortion
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参考文献9

  • 1卢网平,朱骏,惠荣,陆文峰,陈小兵.La掺杂对Sr_2Bi_4Ti_5O_(18)铁电陶瓷性能的影响[J].功能材料,2003,34(5):562-563. 被引量:8
  • 2黄平,徐廷献,孙清池.铋层状化合物Sr_(0.3)Ba_(0.7)Bi_(4-x)La_xTi_4O_(15)陶瓷材料的介电性能[J].硅酸盐学报,2004,32(7):808-811. 被引量:13
  • 3WHITE G S,RAYNES A S,VAUDIAM D,et al.Fatigue behavior of cyclically loaded PZT[J].J Am Ceram Soc,1994,77(6):2 603-2 608.
  • 4PAZ DE ARAUJO C,CUCHIARO J D,MCMIILLAN L D,et al.Fatigue-free ferroelectric capacitors whit platinum electrodes[J].Nature,1999,374(6 523):627-629.
  • 5ZANETTI S M,ARAUJO E B,LEITE E R,et al.Structural and electrical properties of SrBi2Nb2O9 thin films prepared by chemical aqueous solution at low temperature[J].Mater Lett,1999,40(1):33-38.
  • 6SHIMAKAWA Y,KUBO Y,TAUCHI Y,et al.Crystal and electric structures of Sr4-xLaxTi3O12 ferroelectrics materials[J].Applied physics letter,2001,79(17):2 791-2 793.
  • 7IRIE H,MIYAYAMA M,KUDO T.Structure dependence of ferroelectric properties of bismuth layer-structured ferroelectric single crystals[J].Journal of Applied Physics,2001,90(8):4 089-4 094.
  • 8CHEN Y P,YAO Y Y,BAO Z H,et al.Study on ferroelectric and dielectric properties of La-doped SrBi4Ti4O15 ceramics[J].Material Letter,2003,57(22):3 623-3 628.
  • 9朱骏,卢网平,刘秋朝,毛翔宇,惠荣,陈小兵.La掺杂SrBi_4Ti_4O_(15)铁电材料性能研究[J].物理学报,2003,52(6):1524-1528. 被引量:17

二级参考文献40

  • 1[1]SCOTT J F,ARAUJO C A.Ferroelectric memories[J].Science,1989,246: 1 400-1 405.
  • 2[2]BAO Z H,YAO Y Y,ZHU J S,et al.Study on ferroelectric and dielectric properties of niobium doped Bi4 Ti3 O12 ceramics and thin films prepared by PLD method[J].Mater Lett,2002,56: 861-866.
  • 3[3]CHEN J,HARMER M P,SMYTH D M.Compositional control of ferroelectric fatigue in perovskite ferroelectric ceramics and thin films[J].J Appl Phys,1994,76: 5 394-5 398.
  • 4[4]WHITE G S,RAYNES A S,VAUDIA M D,et al.Fatigue behavior of cyclically loaded PZT[J].J Am Ceram Soc,1994,77:2 603-2 608.
  • 5[5]SHYU J J,LEE C C.Sintering and properties of molybdenumdoped SrBi2Ta2O9ceramics [J].J Eur Ceram Soc,2003,23:1 167-1 173.
  • 6[6]ADACHI M,MATSUZAKI I.Sputter deposition of [111] axis oriented rhombokedral PZT film [J].Jpn Appl Phys,1987,26 : 550-554.
  • 7[7]DESU S B,CHO H,JOSHI P C.Thin films deposited on Si(100) by pulsed highly oriented ferroelectric CaBi2 Nb2 O9laser deposition [J].Appl Phys Lett,1997,70:1 393-1 395.
  • 8[8]PARK B H,HYUN S J,BUS D,et al.Differences in nature of defects between SrBi2Ta2O9and Bi4 Ti3 O12 [J].Appl Phys Lett,1999,74(13):1 907-1 909.
  • 9Park B H, Kang B S, Bu S D et al 1999 Nature 401 683.
  • 10Zhao M L, Wang C L, Zhong W L, Zhang p L and Wang J F 2002.Acta Phys. Sin. 51 420 (in Chinese).

共引文献31

同被引文献57

  • 1杨群保,荆学珍,李永祥,王东,王天宝.无铅压电陶瓷研究的新进展[J].电子元件与材料,2004,23(11):56-61. 被引量:22
  • 2张丽娜,李国荣,赵苏串,郑嘹赢,殷庆瑞.Nb掺杂Bi_4Ti_3O_(12)层状结构铁电陶瓷的电行为特性研究[J].无机材料学报,2005,20(6):1389-1395. 被引量:30
  • 3Hong S, Trolier-McKinstry S, Messing G L. Dielectrie and electromechanical properties of textured niobium-doped bismuth titanate ceramics. J. Am. Ceram. Soc., 2000, 83(1): 113-118.
  • 4Kan Y, Wang P, Li Y, et al. Low-temperature sintering of Bi4Ti3O12 derived from a co-precipitation method. Mater. Lett., 2002, 56(6): 910-914.
  • 5Pavlovic N, Srdic V V. Synthesis and structural characterization of Ce-doped bismuth titanate. Mater. Res. Bull., 2009, 44(4): 860-864.
  • 6Wang C M, Zhang S J, Wang J F, et al. Electromechanieal properties of calcium bismuth niobate (CaBi2Nb2O9) ceramics at elevated temperature. Mater. Chem. Phys., 2009, 118(1): 21-24.
  • 7Watcharapasom A, Siriprapa P, Jiansirisomboon S. Grain growth behavior in bismuth titanate-based ceramics. J Eur Ceram. Soc., 2010, 30(1): 87-93.
  • 8Santos V B, M' Peko J C, Mir M, et al. Mierostructural, structural and electrical properties of La^3+-modified Bi4Ti3O12 ferroelectrie ceramics, J. Eur. Ceram. Soc., 2009, 29(4): 751-756.
  • 9Park J, Bae J S, Park H J, et al. Electric response as a function of applied voltage of Nb-doped Bi4Ti3O12 thin films. Thin Solid Films, 2008, 516(16): 5304-5308.
  • 10Zhang Z, Yan H, Dong X, et al. Preparation and electrical properties of bismuth layer-structured ceramic Bi3NbTiO9 solid solution. Mater. Res. Bull., 2003, 38(2): 241-248.

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