摘要
采用了复合体模型,对常温下硅中金引入的深能级进行了理论上的计算,给出了相应的哈密顿算符,利用区域变分法计算。
A model for a complex with deep level impurities and defects is developed. The Hamiltonian operator of the system is written and with the zone variational method the position of the deep level is located. With this quantum mechanical method, the deep donor and acceptor levels of gold in silicon at room temperature have been calculated. Calculation results agree well with experimental data. It is believed that the method could also be applied to the calculation of the deep levels in silicon with other impurities and defects or some deep levels in other semiconductor materials. It could be helpful to the understanding of the formation mechanism of deep levels in semiconductors.
出处
《华中理工大学学报》
CSCD
北大核心
1997年第2期38-40,共3页
Journal of Huazhong University of Science and Technology
关键词
半导体
深能级
硅
量子力学
杂质
缺陷
deep level in semiconductor
complex
impurities
zone variational method