真空电子器件的失效模式及原因分析

Failure Mode and Cause Analysis of Vacuum Electronic Devices

通过研究真空电子器件可靠性的国内外动态,发现国产真空电子器件的可靠性与国际先进水平相比还存在较大的差距。为了寻找改进的切入点,从器件结构和使用环境两方面讨论了国产真空电子器件的常见失效模式及其失效原因,为进一步地开展国产真空电子器件的可靠性研究进行有益的探索。

Based on the investigation of the reliability status of vacuum electronic devices, it is shown that the reliability of domestic vacuum electronic devices still has a long way to go compared with the imported divices. As the starting point for improvement, the common failure modes and possible failure causes of national vacuum electronic devices are discussed in terms of device structure and application environment, which will be very helpful for the further study on the reliability of domestic vacuum electronic devices.