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面向Top-Down设计流的表面微加工掩膜推导方法 被引量:2

Mask Deduction for Surface Micromachining to Support Top-Down Design Flow
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摘要 针对表面硅微加工,运用层模型间几何元素运算获得粗掩膜的基本数据.采用工艺约束修演得到精掩膜,解决了多层刻蚀与可加工性问题,并进行模型重构,以校正设计模型的工艺不合理性.应用协同的方法解决了设计端模块与工艺端模块的集成问题,最终得到优化的设计模型和掩膜序列. Based on surface micromachini the operation on geometric elements among ng process, the rough mask information is obtained by means of the layer models. The precise mask then is formed by revising the rough mask based on the process restrictions. Together with the reconstruction of the process model, the mask revision resolves the problem of multiple-layer etching and improves the manufacturability. The CAPP and CAD modules for micro devices are integrated coordinately to get an optimized design model and mask set.
作者 刘峥 江平宇
出处 《计算机辅助设计与图形学学报》 EI CSCD 北大核心 2007年第6期798-803,共6页 Journal of Computer-Aided Design & Computer Graphics
基金 国家自然科学基金(50375118).
关键词 微器件 掩膜推导 Top—Down 工艺模型 表面微加工 micro device mask deduction Top-Down process model surface micromachining
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参考文献8

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共引文献6

同被引文献18

  • 1李涛,钟诗胜.基于着色时间Petri网的工作流模型及其性能分析[J].计算机辅助设计与图形学学报,2006,18(6):824-831. 被引量:12
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