期刊文献+

一种基于故障特征分析的总线测试自适应算法 被引量:1

Adaptive Diagnosis Algorithm for Bus-Structured Systems Based on Syndrome Analysis
下载PDF
导出
摘要 针对现有数字总线测试算法故障覆盖率低、效率不高、过程复杂等不足,建立了以区分主、从驱动器网络为特点的总线结构模型;在分析总线结构故障特征的基础上,定义了故障等价的概念,通过对故障模式的等价变换,得到了故障模式最简集合;最后提出了一种基于故障特征分析的自适应测试算法.结果表明,与同类算法相比,该算法在保证故障诊断最大化的前提下,简化了测试流程,降低了测试复杂性,缩减了测试序列长度;且设计简单,易于工程实现. The algorithms which are proposed in literatures have some problems, such as low fault-coverage, bad efficiency and complex process, etc. So the model for bus-structured system was modified, in which master driver and slave drivers were treated individually according to their effects. By analyzed syndromes and fault equivalence transform, all faults were classified, and then, the minimal and simplest faultset was obtained. An adaptive algorithm AAMS based on syndrome analysis was presented. The results show that the AAMS algorithm, compared with the previous algorithms, can support maximal diagnosis, simplify the test process, reduce the test complexity, decrease the test length, therefore, test efficiency is improved. The algorithm also has more practicability.
出处 《电子器件》 CAS 2007年第3期1052-1056,共5页 Chinese Journal of Electron Devices
基金 武器装备预研课题资助项目(412030102)
关键词 数字总线测试 故障特征 自适应算法 bus-structured test syndrome adaptive-algorithm
  • 相关文献

参考文献6

  • 1Dickinson P J,Wilkins B R.Interconnect Testing for Bus-Structured Systems[C]//Proceedings of European Test Conference.Rotterdam,1993:476-483.
  • 2IEEE Standard 1149.1-2001.IEEE Standard Test Access Port and Boundary Scan Architechture[S].IEEE Standards Board,New York,2001.
  • 3Jarwalal N,Yau C W.A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects[C]//IEEE International Test Conference.Washington,1989:63-70.
  • 4Lien J C,Breuer M A.Maximal Diagnosis for Wiring Networks[C]//IEEE International Test Conference.Nashville,1991:96-105.
  • 5Zhao Jun,Fred J M,Fabrizio L.Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems[J].Design & Test of Computers,2002,19(1):54-64.
  • 6Yong J K,Dong S S,Yong S S,Sung H C,Sung H K.A New Maximal Diagnosis Algorithm for Bus-Structured Systems[C]//IEEE International Test Conference.Charlotte,2003:31-39.

同被引文献4

  • 1Feng W Y,Karimi F, Fabrizio L. Fault detection in tristate system environment[ J ]. IEEE Micro,2001,21 (5) :77 - 85
  • 2IEEE Std 1149. 1-2001, IEEE standard test access port and boun-dary scan architecture[ S]
  • 3Zhao J,Fred J M,Fabrizio L. Analyzing and diagnosing interconnect faults in bus-structured systems [ J]. IEEE Design & Test of Computers ,2002,19 ( 1 ) :54 - 64
  • 4Kim Y J, Song D S, Shin Y S, et al. A new maximal diagnosis algorithm for bus-structured systems [ C ]//Anthony A. International Test Conference. Washington,DC : IEEE ,2003:31 - 39

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部