原子荧光光谱法测定电子电气产品中铬(VI)的方法研究

The Research of the Determination of Hexavalent Chromium[Cr (VI)] by the Atom Fluorescence Spectrum Method

应用原子荧光光谱法测定电子电气产品中铬(Ⅵ)的含量,可适应RoHS中各种复杂样品的检测以及改善样品消解等诸多实际问题。其相对标准偏差(RSD):2.03%;检出限:0.0646mg/L;线性范围宽,校准曲线的线性相关系数应大于0.999等。有效地将铬(Ⅵ)、铬(III)分离,并有效地消除基体干扰等,完全能够适应电子电气产品中铬(Ⅵ)的测定。

The atom fluorescence spectrum method is applied to determine the contents of chromium （Ⅵ） from the electron electricity product, dispels for adapting to various complicated RoHS sample detecting and improving a sample waiting for a lot of actual problem, the main body of a book to have been in progress studying. The relative standard deviation （RSD）： 2.03%; Inspect up out a limit： 0.064 6 mg/L; Linearity range width, the linearity relevance modulus adjusting a curve＇s respond to 0.999 grade greater than. The chromium （Ⅵ） and chromium （Ⅲ） can be separated, The method can eliminating base the body disturbance waits, It can be able to adapt to the electron electricity product middle chromium （Ⅵ） completely.