摘要
分析了高频数字集成电路产生电磁发射的原因及其电磁发射的测量原理,简要说明了集成电路电磁骚扰的几种测试方法及其理论依据,介绍了法拉第笼法与磁场探头法的测试系统及其在产品设计方面的应用前景。
Analysis the cause of Integrated circuits electromagnetic emission and principle of test. Several electromagnetic emission test methods be described. In particular, test system and it＇s function of workbench faraday cage method and magnetic probe method be introduced in detail.
