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从边界扫描技术协议讨论其发展与应用 被引量:2

Discussion on Development and Application of Perimeter Scan Technology Protocol
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摘要 边界扫描测试技术作为当前电子测试技术的热点,其应用与发展是令人瞩目的。本文通过对边界扫描技术一系列协议的简单介绍和剖析,讨论了边界扫描技术各个阶段的应用与发展情况,并对边界扫描技术未来的发展给出了一些预测。 As a hot issue among current electronic testing technologies, the development and application of perimeter scan testing technology is significant. The article gives the brief introduction and analysis on perimeter scan technology protocols, discusses the application and development of perimeter scan technology in different stages and makes some predictions for the future development of perimeter scan technology.
出处 《电子质量》 2007年第6期59-61,共3页 Electronics Quality
关键词 边界扫描 IEEE1149.1 IEEE1149.4 IEEE1149.5 IEEE1149.6 IEEE1532 Perimeter scan IEEE1149.1 IEEE1149.4 IEEE1149.5 IEEE1149.6 IEEE1532
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参考文献16

  • 1Barry Odbert.Boundary-Scan In Manufacturlng Applications.
  • 2CJ Clark;MiKe Ricchetti.New Strategies for cost effective production PCB test and Configuration.
  • 3Steve Sunter;Neil Jacobson;Bill Eklow.Status of IEEE Testability Standards 1149.4.1532 and 1149.6,2004.
  • 4Ray Dellecker.Boundary-Scan Bursts into the Modern Production Facility,2001.
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  • 7IEEE Std 1149.6-2003.IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks,2003.
  • 8Bradford G Van Treuren;Jose M Miranda.EMBEDDED BOUNDARY-SCAN TESTING,2003.
  • 9IEEE Std 1149.5-1995.IEEE Standard for Module Test and Maintenance Bus(MTM-Bus)Protocol,1995.
  • 10Andrzej Rucinski;Barbara Dziurla-Rucinska.Boundary Scan as a Test Solution in Microelectronics Curricula,2002.

二级参考文献10

  • 1IEEE Std 1149.1 - 2001, IEEE Standard Test Access Port and Boundary - Scan Architecture[S].
  • 2IEEE Std 1149.4 - 1999, IEEE Standard for a Mixed Signal Test Bus[S].
  • 31149.5 - 1995 IEEE Standard for Module Test and Maintenance Bus (MTM- Bus) Protocol[ S].
  • 4IEEE Std 1149.6 - 2003, IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks[S].
  • 5IEEE 1149.1. IEEE Standard Test Access Port and Boundary-Scan Architecture[S]. 2001.
  • 6IEEE 1149.4. IEEE Standard for a Mixed Signal Test Bus[S]. 1999.
  • 7IEEE 1149.5. IEEE Standard Module Test and Maintenance (MTM) Bus Protocol[S]. 1995.
  • 8IEEE P1500. IEEE Standard for Embedded Core Test[EB/OL]. http://grouper. ieee. org/groups/1500/.
  • 9NEXUS 5001 Forum[EB/OL]. http://www, ieee-isto. org/Nexus5001/about. html.
  • 10陈光(礻禹).可测性设计技术[M].北京:电子工业出版社,1997..

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二级引证文献3

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